Details

U-8/PO
Improvement on sensitivity for the track - etch neutron radiography
F. Pugliesi; M.A. Stanojev Pereira; V. Sciani; R. Pugliesi
Instituto de Pesquisas Energeticas e Nucleares (IPEN-CNEN/SP) São Paulo-SP, Brazil

Abstract:
One of the main restrictions to the employment of the track-etch neutron radiography technique, is the low-intrinsic optical contrast achieved in the recorded image that leads to a poor sensitivity to discern thickness changes of the materials. The sensitivity is determined by measuring the light transmitted through the images and for such purpose, conventional analog optical microphotometers are typically employed. In the present work a digital system has been employed to measure the light transmitted and a significant improvement in the sensitivity was achieved.

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